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1

An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch

Subhayu Basu, Indranil Sengupta, Dipanwita Roy Chowdhury, Sudipta Bhawmik

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 167 KB

english, 2002

2

[IEEE Comput. Soc VLSI Design 2000. Thirteenth International Conference on VLSI Design - Calcutta, India (3-7 Jan. 2000)] VLSI Design 2000. Wireless and Digital Imaging in the Millennium. Proceedings of 13th International Conference on VLSI Design - Core Based ASIC Design

Higgins, F., Bhawmik, S.

Year:

2000

Language:

english

File:

PDF, 4 KB

english, 2000

3

Efficient characterisation of cellular automata

Das, A.K., Ganguly, A., Dasgupta, A., Bhawmik, S., Chaudhuri, P.P.

Journal:

IEE Proceedings E Computers and Digital Techniques

Year:

1990

Language:

english

File:

PDF, 690 KB

english, 1990

4

Expert system to configure global design for testability structure in a VLSI circuit

Sudipta Bhawmik, Parimal Palchaudhuri

Journal:

Microprocessors and Microsystems

Year:

1989

Language:

english

File:

PDF, 955 KB

english, 1989

5

KIDLAN: A hardware description language

Anurag Acharya, Sudipta Bhawmik, C.R.K. Prasad, P. Palchaudhuri

Journal:

Microprocessing and Microprogramming

Year:

1989

Language:

english

File:

PDF, 919 KB

english, 1989

6

Integration of partial scan and built-in self-test

Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik

Journal:

Journal of Electronic Testing

Year:

1995

Language:

english

File:

PDF, 1.15 MB

english, 1995

7

Selecting test methodologies for PLAs and random logic modules in VLSI circuits — an expert systems approach

Sudipta Bhawmik, V.K. Narang, Parimal Pal Chaudhuri

Journal:

Integration, the VLSI Journal

Year:

1989

Language:

english

File:

PDF, 754 KB

english, 1989

8

DFT Expert: designing testable VLSI circuits

Bhawmik, S., Palchaudhuri, P.

Journal:

IEEE Design & Test of Computers

Year:

1989

Language:

english

File:

PDF, 819 KB

english, 1989

9

Design of testable VLSI circuits with minimum area overhead

Chalasani, P.R., Bhawmik, S., Acharya, A., Palchaudhuri, P.

Journal:

IEEE Transactions on Computers

Year:

1989

Language:

english

File:

PDF, 355 KB

english, 1989

10

A BIST scheme for RTL circuits based on symbolic testability analysis

Ghosh, I., Jha, N.K., Bhawmik, S.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2000

Language:

english

File:

PDF, 351 KB

english, 2000

11

On improving test quality of scan-based BIST

Huan-Chih Tsai, Kwang-Ting Cheng, Bhawmik, S.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2000

Language:

english

File:

PDF, 243 KB

english, 2000

12

[IEEE Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013) - Goa, India (1999.01.10-1999.01.10)] Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013) - POWERTEST: a tool for energy conscious weighted random pattern testing

Xiaodong Zhang,, Roy, K., Bhawmik, S.

Year:

1999

Language:

english

File:

PDF, 210 KB

english, 1999

13

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Impact of mid-bond testing in 3D stacked ICs

Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan, Bhawmik, Sudipta

Year:

2013

Language:

english

File:

PDF, 247 KB

english, 2013

14

[IEEE Comput. Soc. Press Tenth International Conference on VLSI Design - Hyderabad, India (4-7 Jan. 1997)] Proceedings Tenth International Conference on VLSI Design - A practical method for selecting partial scan flip-flops for large circuits

Ghosh, I., Bhawmik, S.

Year:

1997

Language:

english

File:

PDF, 512 KB

english, 1997

15

[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - PSBIST: A partial-scan based built-in self-test scheme

Lin, C.-J., Zorian, Y., Bhawmik, S.

Year:

1993

Language:

english

File:

PDF, 966 KB

english, 1993

16

[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - An almost full-scan BIST solution-higher fault coverage and shorter test application time

Huan-Chih Tsai,, Bhawmik, S., Kwane-Ting Cheng,

Year:

1998

Language:

english

File:

PDF, 734 KB

english, 1998

17

Efficient test-point selection for scan-based BIST

Huan-Chih Tsai,, Kwang-Ting Cheng,, Chih-Jen Lin,, Bhawmik, S.

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

1998

Language:

english

File:

PDF, 246 KB

english, 1998

18

Book & Software Reviews

Bhawmik, Nani G.

Journal:

Water International

Year:

1997

Language:

english

File:

PDF, 79 KB

english, 1997

19

[IEEE IEEE 1991 Custom Integrated Circuits Conference - San Diego, CA, USA (12-15 May 1991)] Proceedings of the IEEE 1991 Custom Integrated Circuits Conference - Pascant: a partial scan and test generation system

Bhawmik, S., Lin, C.J., Cheng, K.-T., Agrawal, V.D.

Year:

1991

Language:

english

File:

PDF, 445 KB

english, 1991

20

[IEEE Comput. Soc 7th Asia and South Pacific Design Automation Conference. 15h International Conference on VLSI Design - Bangalore, India (7-11 Jan. 2002)] Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conference on VLSI Design - Reformatting test patterns for testing embedded core based system using test access mechanism (TAM) switch [SoC]

Basu, S., Mukhopadhay, D., Roychoudhury, D., Sengupta, I., Bhawmik, S.

Year:

2002

Language:

english

File:

PDF, 275 KB

english, 2002

21

[IEEE 1988., IEEE International Symposium on Circuits and Systems - Espoo, Finland (7-9 June 1988)] 1988., IEEE International Symposium on Circuits and Systems - An integrated CAD environment for design of testable VLSI circuits

Bhawmik, S., Halder, T.K., Palchaudhuri, P.

Year:

1988

File:

PDF, 277 KB

1988

22

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - At-speed interconnect testing and test-path optimization for 2.5D ICs

Wang, Ran, Chakrabarty, Krishnendu, Bhawmik, Sudipta

Year:

2014

Language:

english

File:

PDF, 833 KB

english, 2014

23

[IEEE 34th Design Automation Conference - Anaheim CA (June 9-13, 1997)] Proceedings of the 34th Design Automation Conference - A Hybrid Algorithm For Test Point Selection For Scan-based Bist

Huan-Chih Tsai,, Kwang-Ting Cheng,, Chih-Jen Lin,, Bhawmik, S.

Year:

1997

Language:

english

File:

PDF, 722 KB

english, 1997

24

[IEEE 2014 32nd IEEE International Conference on Computer Design (ICCD) - Seoul, South Korea (2014.10.19-2014.10.22)] 2014 IEEE 32nd International Conference on Computer Design (ICCD) - Built-in self-test for interposer-based 2.5D ICs

Wang, Ran, Chakrabarty, Krishnendu, Bhawmik, Sudipta

Year:

2014

Language:

english

File:

PDF, 1.32 MB

english, 2014

25

Interconnect Testing and Test-Path Scheduling for Interposer-Based 2.5-D ICs

Wang, Ran, Chakrabarty, Krishnendu, Bhawmik, Sudipta

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 3.05 MB

english, 2015

26

[ACM Press the 35th annual conference - San Francisco, California, United States (1998.06.15-1998.06.19)] Proceedings of the 35th annual conference on Design automation conference - DAC '98 - A BIST scheme for RTL controller-data paths based on symbolic testability analysis

Ghosh, Indradeep, Jha, Niraj K., Bhawmik, Sudipta

Year:

1998

Language:

english

File:

PDF, 131 KB

english, 1998

27

[ACM Press the 34th annual conference - Anaheim, California, United States (1997.06.09-1997.06.13)] Proceedings of the 34th annual conference on Design automation conference - DAC '97 - A hybrid algorithm for test point selection for scan-based BIST

Tsai, Huan-Chih, Lin, Chih-Jen, Bhawmik, Sudipta, Cheng, Kwang-Ting

Year:

1997

Language:

english

File:

PDF, 254 KB

english, 1997

28

[ACM Press the first international conference - Tullahoma, Tennessee, United States (1988..-..)] Proceedings of the first international conference on Industrial and engineering applications of artificial intelligence and expert systems - IEA/AIE '88 - DFTEXPERT: an expert system for design of testable VLSI circuits

Bhawmik, Sudipta, Chaudhuri, P. Pal

Year:

1988

Language:

english

File:

PDF, 758 KB

english, 1988

29

[ACM Press the 28th conference - San Francisco, California, United States (1991.06.17-1991.06.22)] Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 - Enhanced controllability for I DDQ test sets using partial scan

Chakraborty, Tapan J., Bhawmik, Sudipta, Bencivenga, Robert, Lin, C. J.

Year:

1991

Language:

english

File:

PDF, 412 KB

english, 1991

30

[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - Improving the test quality for scan-based BIST using a general test application scheme

Tsai, Huan-Chih, Cheng, Kwang-Tin, Bhawmik, Sudipta

Year:

1999

Language:

english

File:

PDF, 99 KB

english, 1999

31

Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC

Wang, Ran, Chakrabarty, Krishnendu, Bhawmik, Sudipta

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2015

File:

PDF, 5.19 MB

2015

32

Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC

Wang, Ran, Chakrabarty, Krishnendu, Bhawmik, Sudipta

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2015

Language:

english

File:

PDF, 5.19 MB

english, 2015

33

[IEEE 2013 IEEE International 3D Systems Integration Conference (3DIC) - San Francisco, CA, USA (2013.10.2-2013.10.4)] 2013 IEEE International 3D Systems Integration Conference (3DIC) - Using 3D-COSTAR for 2.5D test cost optimization

Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan, Bhawmik, Sudipta

Year:

2013

Language:

english

File:

PDF, 514 KB

english, 2013

34

[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - A BIST scheme for the detection of path-delay faults

Mukherjee, N., Chakraborty, T.J., Bhawmik, S.

Year:

1998

File:

PDF, 798 KB

1998

35

[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - A BIST scheme for the detection of path-delay faults

Mukherjee, N., Chakraborty, T.J., Bhawmik, S.

Year:

1998

Language:

english

File:

PDF, 798 KB

english, 1998

36

KET—A Tool for Building Expert Systems

Bhawmik, Sudipta, Athawale, P V, Palchaudhuri, Parimal

Journal:

IETE Journal of Research

Year:

1988

Language:

english

File:

PDF, 906 KB

english, 1988

37

Automated Design For Testability (DFT) Tools for VLSI Circuits

Bhawmik, Sudipta, Das, Aloke K, Palchaudhuri, Parimal

Journal:

IETE Journal of Research

Year:

1988

Language:

english

File:

PDF, 1.04 MB

english, 1988

38

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - The P1500 DFT disclosure document: a standard to communicate mergeable core DFT data

Wahl, M.G., Bhawmik, S., Zarrineh, K., Ghosh, P., Davidson, S., Harrod, P.

Year:

2003

Language:

english

File:

PDF, 1.14 MB

english, 2003

39

âDeath is a better option than being treated like thisâ: a prevalence survey and qualitative study of depression among multi-drug resistant tuberculosis in-patients

Huque, R., Elsey, H., Fieroze, F., Hicks, J. P., Huque, S., Bhawmik, P., Walker, I., Newell, J.

Journal:

BMC Public Health

Year:

2020

File:

PDF, 593 KB

2020

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